SEMICONDUCTOR MATERIAL AND DEVICE CHARACTERIZATION BY DIETER K SCHRODER EBOOK

Library of Congress Cataloging-in-Publication Data: Schroder, Dieter K. Semiconductor material and device characterization / by Dieter K. Schroder. p. cm. 10 Feb Dieter K. Schroder Semiconductor Material and Device Characterizationremains the sole text dedicated to characterization techniques. Semiconductor material and device characterization. Front Cover. Dieter K. Schroder. Wiley, – Technology & Engineering – pages.

Author: Kigarr Megore
Country: Azerbaijan
Language: English (Spanish)
Genre: Medical
Published (Last): 21 October 2011
Pages: 497
PDF File Size: 15.93 Mb
ePub File Size: 11.65 Mb
ISBN: 841-6-58621-918-4
Downloads: 71451
Price: Free* [*Free Regsitration Required]
Uploader: Goltilkree

Semiconductor Material and Device Characterization

My library Help Advanced Book Search. Coverage includesthe full range of electrical and optical characterization schrodeg the more specialized chemical and physical techniques. Appendix 2 Abbreviations and Acronyms. Contact Resistance and Schottky Barriers. Written by the main authority in the field of semiconductor characterization.

Semiconductor Material and Device Characterization – Dieter K. Schroder – Google Books

Chapter 2 Carrier and Doping Density. User Review – Flag as inappropriate funcion trabajo pp’2. The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments semiconductor material and device characterization by dieter k schroder the field and includes new pedagogical tools to assist readers.

Chapter 10 Optical Characterization. Would you like to change to the site? Readers familiar with the previous two editions will discover athoroughly revised and updated Third Editionincluding:. Coverage includes the full range semiconductor material and device characterization by dieter k schroder electrical and optical characterization methods, including the more specialized chemical and physical techniques.

Chargebased and Probe Characterization. Updated and revised figures and examples reflecting the mostcurrent data and information new references offering access to the latest research anddiscussions in specialized topics New problems and review questions at the end of each chapter totest readers’ understanding of the material In addition, readers will find fully updated and revisedsections in each chapter.

Schroder Limited preview – It covers the full range of electrical and optical characterization methods while thoroughly treating the more specialized chemical and physical techniques. Permissions Request permission to reuse content from this site.

No eBook available Wiley. Reliability and Failure Analysis examines failure times anddistribution functions, semicondctor discusses electromigration, hotcarriers, gate oxide integrity, negative bias temperatureinstability, stress-induced leakage current, and electrostaticdischarge.

Semiconductor Material xemiconductor Device Characterization remains the sole text dedicated to characterization techniques formeasuring semiconductor materials and devices. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remainsessential reading for graduate students as well as forprofessionals working in the field of semiconductor devices andmaterials.

Semiconductor Material and Device Characterization.

From scanning probe techniques to the detection of metallic impurities in silicon wafers to the use of microwave reflection to measure contactless resistivity, each chapter presents state-of-the-art tools and techniques, most of which were in their infancy or had not yet been developed when the previous edition first came out.

Semiconductor material and device characterization Dieter K. Semiconductor material and device characterization Dieter K.

Readers familiar with the previous two editions will discover athoroughly revised and updated Third Editionincluding: Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Editionincluding: Selected pages Title Page.

Chemical and Physical Characterization. Updated and revised figures and examples reflecting the mostcurrent data and information semiconductor material and device characterization by dieter k schroder references offering access to the latest research anddiscussions in specialized topics New problems and review questions at the end of each chapter totest readers’ understanding of the material In addition, readers will find fully updated and revisedsections in each chapter.

Reliability characterizqtion Failure Analysis examines failure times anddistribution functions, and discusses electromigration, hotcarriers, gate oxide integrity, negative bias temperatureinstability, stress-induced leakage current, and electrostaticdischarge.

Semiconductor Material and Device Characterization, 3rd Edition

Semiconductor Material and Device Characterization. Readers familiar with the previous two editions will discover athoroughly revised and updated Third Editionincluding:.

Semiconductor material and device characterization Dieter K.

Semiconductor Material and Device Characterization is the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices.